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The OS Dual Beam Laser Thickness Monitor (OS-LTM-VIS-IR) is designed for the use with low energy gap materials (Eg < 1.82 eV). The visible 632.8 nm laser is used for optical alignment while the infrared laser (830 nm) is used for measurement.

Characteristics

Operation	remote and in situ
Laser wavelength (nm)	IR Laser 830 nm + alignment laser 632.8 nm
Port Mount	UHV DN40CF (standard)	other mountings on demand
Usage	for low Eg materials (Eg<1.82 eV)
Sensitivity (nm)	up to a few nm	depending on the refractive index
Operating System for measuring Software	Windows XP or more recent	desktop PC with a PCI slot*

* An RF noise shielded PC (not included) is recommended for the use in connection with a PPD System.